Ovenless Burn-In & HTOL solution

The Ovenless Burn‑In & HTOL Solution from Microtest offers a groundbreaking, eco-friendly alternative to traditional burn-in ovens. Designed for high-density device testing, it delivers per‑DUT independent thermal control without ovens, dramatically reducing energy usage, cooling requirements, and facility footprint.
This rack-based platform includes a Burn-In System (BIS) and racks with 24 internal slots, each slot accommodating up to 120 devices—enabling fully automated, large-scale burn-in and HTOL cycles. The system achieves faster temperature ramp-up/cool-down and precise thermal regulation at the DUT level—significantly improving test efficiency and uniformity.
Its green credentials are impressive, with lower power consumption and a reduced carbon footprint, aligning with ESG and Industry 4.0 initiatives.
Measuring approximately 2000 mm (H) × 1200 mm (W) × 1300 mm (D), this solution is SECS‑GEM compliant and cleanroom-ready, easily integrating into existing production lines. Its versatile application spans across sectors—from automotive, medical, MEMS and consumer electronics to aerospace, defence, industrial, and power semiconductors.
In summary, the Ovenless Burn‑In & HTOL Solution combines cutting-edge thermal management, sustainable operation, and high-throughput automation—providing manufacturers with a smarter, cleaner, and more efficient platform for reliability testing of semiconductor devices.