Burn-In

Microtest’s Ovenless Burn-In & HTOL Solution sets a new standard in reliability testing for semiconductors. Designed for efficiency, this system eliminates the need for traditional thermal ovens by using localized, independent heating for each device under test (DUT). The result is a highly energy-efficient process that reduces power consumption by up to 40% and minimizes thermal dispersion.

Its compact, modular architecture ensures a 45% smaller footprint compared to conventional systems, optimizing space and enabling high-density testing. Fully automated and SECS/GEM-compliant, it integrates easily into smart factory environments and supports Industry 4.0 initiatives.

Engineered for sustainability, cost-effectiveness, and ease of use, the ovenless burn-in platform delivers precise, safe, and scalable high-temperature testing. It’s the ideal solution for manufacturers seeking to enhance performance, reduce operational costs, and align with ESG targets without compromising on quality or throughput.